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Possible ways to determine the migration energy of point defects using atomic-force microscopy

Year: 1994

Type: article

Source: Technical Physics Letters

Authors: E. V. Blagov, G. L. Klimchitskaya, V. M. Mostepanenko, V. I. Panov, Igor Sokolov

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3190735696

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