Work

Impact of Threshold Voltage Instabilities of SiC MOSFETs on the Methodology of Power Cycling Tests

Year: 2021

Type: article

Authors: Carsten Kempiak, Andreas Lindemann

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3198397891

FWCI: 0.367

Cites:

Cited by: 5

Related to: 10