Work

HARP: Practically and Effectively Identifying Uncorrectable Errors in Memory Chips That Use On-Die Error-Correcting Codes

Year: 2021

Type: conference-paper

Abstract: Aggressive storage density scaling in modern main memories causes increasing error rates that are addressed using error-mitigation techniques. State-of-the-art techniques for addressing high error rates identify and repair bits that are at risk of error from within the memory controller. Unfortunately, modern main memory chips internally use on-die error correcting codes (on-die ECC) that obfuscate the memory controller’s view of errors, complicating the process of identifying at-risk bits (i.e., error profiling).

Source: IEEE/ACM International Symposium on Microarchitecture (MICRO)

DOI: 10.1145/3466752.3480061

Authors: Minesh Patel, Geraldo Francisco de Oliveira, Onur Mutlu

Institution: ETH Zurich

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

Funder: VMware

OpenAlex ID: W3201819476

FWCI: 4.258

Cites: 161

Cited by: 17

Related to: 10