Remaining Useful Lifetime Prediction and Noisy Stochastic Deterioration Process Considering Sensor Degradation
Year: 2021
Type: conference-paper
Authors: Hassan Hachem, Hai Canh Vu, Mitra Fouladirad
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3202611280
