Year: 2022
Type: article
Abstract: Quantum metrology methods are well suited when measuring a single parameter, but more than one remains challenging. A new tool for benchmarking the precision of multiple parameter measurements could help further development.
Source: Physical Review X
Institutions: University of Warwick, University of Warsaw
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $4,200
Funder: Narodowe Centrum Nauki
Award: G1441617360
OpenAlex ID: W3204882562