Work

Local structure determination using total scattering data

Year: 2021

Type: book-chapter

Source: Elsevier eBooks

DOI: 10.1016/b978-0-12-823144-9.00040-6

Authors: Simon J.L. Billinge, Sandra H. Skjaervoe, Maxwell W. Terban, Songsheng Tao, Long Yang, Yevgeny Rakita, Benjamin A. Frandsen

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3209042811

FWCI: 2.32

Cites: 181

Cited by: 13

Related to: 10