Work

Nanoscale Fabrication and Electronic Characterization of Chemically Modified Silicon Surfaces Using Conductive Atomic Force Microscopy in Liquids

Year: 2002

Type: conference-abstract

Source: APS March Meeting Abstracts

Authors: Matthew W. Such, Reagan Kinser, Cinthia Herrera, Mark C. Hersam

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3209569931

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