Work

High-speed analysis of spectroscopic ellipsometry data using deep learning methods

Year: 2021

Type: conference-paper

Source: OSA Advanced Photonics Congress

DOI: 10.1364/iprsn.2021.jw3d.4

Authors: Yifei Li, Yifeng Wu, Heshan Yu, Ichiro Takeuchi, Rafael Jaramillo

Institutions: Massachusetts Institute of Technology, University of Maryland, College Park

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3209595272

FWCI:

Cites: 6

Cited by: 1

Related to: 10