Work

Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions

Year: 2012

Type: book-chapter

Source: Elsevier eBooks

DOI: 10.1016/b978-1-4377-7883-0.00006-7

Authors: Frank M. Etzler, Jaroslaw Drelich

Institutions: Lake Erie College of Osteopathic Medicine, Michigan Technological University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W32403697

FWCI: 5.305

Cites: 68

Cited by: 21

Related to: 10