Work

Reduction of emitter-collector leakages by ion implantation

Year: 1976

Type: article

Source: Technical digest - International Electron Devices Meeting/Technical digest

Authors: Goutam Das, T. H. Yeh

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: King's College London

OpenAlex ID: W37302134

FWCI:

Cites: 39

Cited by:

Related to: 10