Analysis of refraction and scattering image artefacts in x-ray analyzer-based imaging
Year: 2022
Type: article
Source: Chinese Physics B
Authors: Li-Ming Zhao, Tian-Xiang Wang, Run-Kang Ma, Yao Gu, Meng-Si Luo, Heng Chen, Zhi-Li Wang, Xin Ge
Institutions: Hefei University of Technology, Shenzhen Bay Laboratory
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4224242113