Work

Measuring knowledge exploration distance at the patent level: Application of network embedding and citation analysis

Year: 2022

Type: article

Source: Journal of Informetrics

DOI: 10.1016/j.joi.2022.101286

Authors: Jaewoong Choi, Janghyeok Yoon

Institutions: Korea Institute of Science and Technology, Konkuk University

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: Ministry of Education, Ministry of Trade, Industry and Energy, National Research Foundation of Korea, Korea Institute of Energy Technology Evaluation and Planning

Awards: G5060533225, G6734239160

OpenAlex ID: W4226399706

FWCI: 7.236

Cites: 50

Cited by: 40

Related to: 10