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The case for lifetime reliability-aware microprocessors

Year: 2004

Type: conference-paper

Source: Proceedings - International Symposium on Computer Architecture/Proceedings

DOI: 10.1109/isca.2004.1310781

Authors: J. Srinivasan, S.V. Adve, P. Bose, J.A. Rivers

Institutions: University of Illinois Urbana-Champaign, IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4231523873

FWCI: 7.474

Cites: 21

Cited by: 217

Related to: 10