Work

REscope: High-dimensional statistical circuit simulation towards full failure region coverage

Year: 2014

Type: conference-paper

Source: ACM/IEEE Design Automation Conference (DAC)

DOI: 10.1109/dac.2014.6881409

Authors: Wei Wu, Wenyao Xu, Rahul Krishnan, Yen-Lung Chen, Lei He

Institutions: University of California, Los Angeles, University at Buffalo, State University of New York

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4231774246

FWCI: 1.195

Cites: 22

Cited by: 8

Related to: 10