Readiness Testing
Year: 2012
Type: reference-entry
Source: Springer eBooks
Authors: William H. Shoff, Catherine T. Shoff, Suzanne M. Shepherd, Jonathan L. Burstein, Calvin A. Brown, Ashita J. Tolwani, Bala Venkatesh, J. Cohen, Brian H. Williams, Joseph P. Minei, Eric A. J. Hoste, Inneke E. De laet, Jason M. Phillips, Wilson Molina, Fernando J. Kim, John R. Prowle, Rinaldo Bellomo, Paul M. Palevsky, Paul M. Palevsky, Paul M. Palevsky, R. T. Noel Gibney, Thomas Bein, Alois Philipp, Franco Valenza, Matteo Parotto, Luciano Gattinoni, Frederick A. Moore, David V. Feliciano, Marcel M. Levi, Jeffrey N. Harr, Max V. Wohlauer, Ernest E. Moore
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4234335035