Work

Behaviour of Natural and Implanted Iron during Annealing of Multicrystalline Silicon Wafers

Year: 2005

Type: book-chapter

Source: Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena

DOI: 10.4028/3-908451-13-2.519

Authors: Daniel Macdonald, Thomas Roth, L.J. Geerligs, Andres Cuevas

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4234986875

FWCI:

Cites:

Cited by:

Related to: 10