Work

Fault injection into VHDL models: the MEFISTO tool

Year: 2002

Type: conference-paper

Source: IEEE International Symposium on Fault-Tolerant Computing

DOI: 10.1109/ftcs.1994.315656

Authors: E. Jenn, J. Arlat, M. Rimen, J. Ohlsson, J. Karlsson

Institutions: Centre National de la Recherche Scientifique, Laboratoire d'Analyse et d'Architecture des Systèmes, Chalmers University of Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4235799760

FWCI: 37.92

Cites: 13

Cited by: 316

Related to: 10