Work

Combined XRD and XRF Analysis for Portable and Remote Applications

Year: 1994

Type: article

Source: Advances in X-ray Analysis

DOI: 10.1154/s037603080001795x

Authors: Jonathan A. Kerner, Edward D. Franco, John Marshall

Institution: Search for Extraterrestrial Intelligence

Language: English

Topic: X-ray Spectroscopy and Fluorescence Analysis

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4239865857

FWCI:

Cites:

Cited by:

Related to: 10