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Microsystems
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Year:
2000
Type:
article
Source:
Measurement and Control
DOI:
10.1177/002029400003300901
Language:
English
Topic:
Advanced MEMS and NEMS Technologies
Subfield:
Electrical and Electronic Engineering
Field:
Engineering
Domain:
Physical Sciences
Open Access status:
bronze
OpenAlex ID:
W4241535900
FWCI:
Cites:
Cited by:
Related to:
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