Work

Radiation damage and single event effect results for candidate spacecraft electronics

Year: 2002

Type: conference-paper

Abstract: We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy-ion induced single-event effects and proton-induced damage. We also present data on the susceptibility of parts to functional degradation resulting from total ionizing dose at low dose rates (0.003-4.52 rads(Si)/s). Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.

Source: IEEE Radiation Effects Data Workshop (REDW)

DOI: 10.1109/redw.2000.896279