Year: 2014
Type: article
Abstract: Silhouettes arise in a variety of imaging scenarios. Pristine silhouettes are often degraded via blurring, detector sampling, and detector noise. We present a maximum a posteriori estimator for the restoration of parameterized facial silhouettes. Extreme dealiasing and dramatic superresolution, well beyond the diffraction limit, are demonstrated through the use of strong prior knowledge.
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4242582210
