Investigation of Mass-Transfer Features with Usage of Ion-Modified Blocking Layer in Commuting Plate of Thermoelements
Year: 2021
Type: article
Abstract: The problem of operation reliability of thermoelectric modules remains topical.Owing to pronounced anisotropy of properties and growth of the rate of semiconductor atoms' mobility, the diffusion of conductor atoms into semiconductor can occur in thermoelements.For prevention of diffusion of conductor atoms into semiconductor and for increasing of thermoelement useful life, diffusive barrier layers are applied for separating commuting plate and semiconductor material in their contact.Deposition of such barrier layers can be realized by different methods, but in all cases the layer is deposited on the semiconductor surface, thus the effectiveness of thermoelectric modules reduces.At present work, mass-transfer processes at diffusion welding in vacuum of copper and nickel through ion-modified layers are investigated.The expediency of prior modification of copper surface (commuting plate) by chromium for creation the barrier antidiffusive layer is determined.Using radioactive isotope method, it is defined the features of diffusive interaction of contact materials through surface layers of copper modified by chromium
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W4243834645
