Work

Handbook of static secondary ion mass spectrometry (SIMS)

Year: 1990

Type: article

Source: Analytica Chimica Acta

DOI: 10.1016/s0003-2670(00)83361-9

Authors: David Briggs, Alan Brown, J.C. Vickerman, F. Adams

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4245913500

FWCI: 6.979

Cites:

Cited by: 117

Related to: 10