Year: 2004
Type: article
Abstract: We discuss how threshold detectors can be used for a direct measurement of the full distribution of current fluctuations and how to exploit Josephson junctions in this respect. We propose a scheme to characterize the full counting statistics from the current dependence of the escape rate measured. We illustrate the scheme with explicit results for tunnel, diffusive, and quasiballistic mesoscopic conductors.
Source: Physical Review Letters
Authors: J. Tobiska, Yu. V. Nazarov
Institution: Delft University of Technology
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4246492294