Work

DIOS-MSEED: A Chip-Based Method for Measurement of Enantiomeric Excess by Kinetic Resolution/Mass Spectrometry

Year: 2001

Type: article

Abstract: The determination of enantiomeric excess by kinetic resolution mass spectrometry has been implemented with the Desorption/Ionization On Silicon (DIOS) MS technique. Measurements can thereby be made much more rapidly than was previously possible, bringing this general methodology for screening asymmetric catalysts closer to true high‐throughput status.

Source: Israel Journal of Chemistry

DOI: 10.1092/tbxu-fd8h-fhm1-nr8h

Authors: ZHOUXIN SHEN, SULAN YAO, JOHN E. CROWELL, GARY SIUZDAK, M.G. FINNa

Institutions: University of California San Diego, Scripps Research Institute

Language: English

Topic: Mass Spectrometry Techniques and Applications

Subfield: Spectroscopy

Field: Chemistry

Domain: Physical Sciences

Open Access status: bronze

Funders: National Science Foundation, National Institutes of Health

Award: The Effect of Dopants on Group IV Surface Chemistry