Work

Research on high quality intelligent test paper generation based on a genetic algorithm

Year: 2016

Type: book-chapter

Source: CRC Press eBooks

Parent work: Information Science and Electronic Engineering: Proceedings of the 3rd International Conference of Electronic Engineering and Information Science (ICEEIS 2016), January 4-5, 2016, Harbin, China

DOI: 10.1201/9781315265278-28

Author: S.M. Gao

Language: English

Topic: Educational Technology and Assessment

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

SDG: Quality education

Open Access status: closed

OpenAlex ID: W4247827650

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