Work

DIVA: a reliable substrate for deep submicron microarchitecture design

Year: 2003

Type: conference-paper

Source: IEEE/ACM International Symposium on Microarchitecture (MICRO)

DOI: 10.1109/micro.1999.809458

Author: T.M. Austin

Institution: University of Michigan

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4248445118

FWCI: 39.02

Cites: 24

Cited by: 390

Related to: 10