Work

Molecularly Thick Layers

Year: 2012

Type: reference-entry

Source: Springer eBooks

DOI: 10.1007/978-90-481-9751-4_100461

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4248650605

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