Work

Photoreflectance spectroscopy of pseudomorphic Si1−XGex (100) structures (x<0·26)

Year: 1995

Type: article

Source: Materials Science and Technology

DOI: 10.1179/026708395790164940

Authors: R. T. Carline, C. Pickering, T. J. C. Hosea, D. J. Hall

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4249380672

FWCI: 0.244

Cites: 13

Cited by: 1

Related to: 10