Work

Sequential PAttern mining using a bitmap representation

Year: 2002

Type: conference-paper

Source: ACM SIGKDD Conference on Knowledge Discovery and Data Mining (KDD)

DOI: 10.1145/775107.775109

Authors: Jay Ayres, Jason Flannick, Johannes Gehrke, Tomi Yiu

Institution: Cornell University

Language: English

Topic: Data Mining Algorithms and Applications

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4250607653

FWCI: 1.002

Cites: 10

Cited by: 139

Related to: 10