Work

Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis

Year: 2012

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.1109/date.2012.6176524

Authors: Yu Cai, E. F. Haratsch, O. Mutlu, Ken Mai

Institution: Carnegie Mellon University

Language: English

Topic: Advanced Data Storage Technologies

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4251178606

FWCI: 6.61

Cites: 16

Cited by: 150

Related to: 10