Work

Relationship Between Leaf Area Index and Yield in Double-Crop and Full-Season Soybean Systems

Year: 2002

Type: article

Source: Journal of Economic Entomology

DOI: 10.1093/jee/95.5.945

Authors: Sean Malone, D. Ames Herbert, David L. Holshouser

Institution: Virginia Tech

Language: English

Topic: Soybean genetics and cultivation

Subfield: Plant Science

Field: Agricultural and Biological Sciences

Domain: Life Sciences

SDG: Zero hunger

Open Access status: closed

Funders: U.S. Department of Agriculture, Virginia Soybean Board

OpenAlex ID: W2177980473

FWCI: 0.442

Cites: 18

Cited by: 40

Related to: 10