Work

Sequential correlation

Year: 2001

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.445406

Authors: Kevin S. Schweiker, Michael J. Mayercik

Institution: United States Air Force Research Laboratory

Language: English

Topic: Advanced Measurement and Detection Methods

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Air Force Research Laboratory

OpenAlex ID: W4252854722

FWCI:

Cites:

Cited by: 1

Related to: 10