Work

Non-raster Methods in Scanning Probe Microscopy

Year: 2019

Type: reference-entry

Source: Encyclopedia of Systems and Control

DOI: 10.1007/978-1-4471-5102-9_100042-1

Author: Sean B. Andersson

Institution: Boston University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4252910338

Cites: 17

Cited by:

Related to: 10