Work

Sequential Optimization and Reliability Assessment Method for Efficient Probabilistic Design

Year: 2002

Type: conference-paper

Source: ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference (IDETC/CIE)

DOI: 10.1115/detc2002/dac-34127

Authors: Xiaoping Du, Wei Chen

Institution: University of Illinois Chicago

Language: English

Topic: Probabilistic and Robust Engineering Design

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4254905555

FWCI: 26.31

Cites:

Cited by: 119

Related to: 10