Work

Surface Chemical and Electronic Characterization of Methyl-Terminated Si(111) and its Interfaces to Metal (Au/Ag) and CdS Heterocontacts by High Resolution Synchrotron X-ray Photoelectron Spectroscopy

Year: 2006

Type: conference-abstract

Source: ECS Meeting Abstracts

DOI: 10.1149/ma2005-01/5/268

Authors: W. Jaegermann, Ralf Hunger, Bengt Jaeckel, Rainer Fritsche, Lauren Webb, Nathan Lewis

Institutions: Technische Universität Darmstadt, California Institute of Technology

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W4255120915

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