Work

Fabric defect detection by Fourier analysis

Year: 2000

Type: article

Source: IEEE Transactions on Industry Applications

DOI: 10.1109/28.871274

Authors: Chi-Ho Chan, G.K.H. Pang

Institution: University of Hong Kong

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4255391993

FWCI: 14.19

Cites: 9

Cited by: 453

Related to: 10