Work

Industrial Implementation of a Dynamic Sampling Algorithm in Semiconductor Manufacturing: Approach and Challenges

Year: 2012

Type: article

Authors: C. Laroque, J. Himmelspach, R. Pasupathy, O. Rose, A. M. Uhrmacher, Justin Nduhura Munga, Stéphane Dauzère-pérès, Claude Yugma

Institutions: STMicroelectronics (France), Mines Saint-Étienne

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

Funder: Université de Lille

OpenAlex ID: W4256331110

FWCI: 0.959

Cites: 13

Cited by: 15

Related to: 10