Work

Error signal artifact in apertureless scanning near-fiel microcospy

Year: 2006

Type: conference-paper

Source: HAL

Authors: Billot, Laurent, Lamy de La Chapelle, Marc, Barchiesi, Dominique, Adam, Pierre-Michel, Bijeon, Jean-Louis, Bachelot, Renaud, Royer, Pascal, Bouhelier, Alexandre, Chang, Shih-Hui, Gray, Stephen, K., Wiederrecht, Gary P., Rogers, John A

Institutions: Institut des Molécules et Matériaux du Mans, Laboratoire Interdisciplinaire Carnot de Bourgogne, Argonne National Laboratory, University of Illinois Urbana-Champaign

Language: English

Topic: Near-Field Optical Microscopy

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4289800938

FWCI:

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Related to: 10