Work

Defect Characterization of Advanced Packages using Novel Phase and Dark Field X-Ray Imaging

Year: 2020

Type: article

Source: EDFA Technical Articles

DOI: 10.31399/asm.edfa.2020-3.p018

Authors: S.H. Lau, Sheraz Gul, Guibin Zan, David Vine, Sylvia Lewis, Wenbing Yun

Institution: Sigray (United States)

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4291927260

FWCI:

Cites:

Cited by: 2

Related to: 10