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Characterization of Frequency Stability
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Year:
1971
Type:
article
Source:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.1971.5570702
Authors:
James A. Barnes,
Andrew R. Chi,
Leonard S. Cutler,
Daniel J. Healey,
David B. Leeson,
Thomas E. McGunigal,
James A. Mullen,
Warren L. Smith,
Richard L. Sydnor,
Robert F. C. Vessot,
Gernot M. R. Winkler
show all 11
Institutions:
National Institute of Standards and Technology,
Goddard Space Flight Center,
Hewlett-Packard (United States),
Westinghouse Electric (United States),
Raytheon (United States),
Jet Propulsion Laboratory,
Smithsonian Astrophysical Observatory
show all 7
Language:
English
Topic:
Advanced Electrical Measurement Techniques
Subfield:
Electrical and Electronic Engineering
Field:
Engineering
Domain:
Physical Sciences
Open Access status:
closed
OpenAlex ID:
W4292232852
FWCI:
26.74
Cites:
19
Cited by:
869
Related to:
10