Work

Optimization of Photodiode Design Through Analysis of Full-Well Capacity and Image Lag in 0.5 μm CMOS Image Sensors With Vertical Transfer Gates

Year: 2022

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/led.2022.3201138

Authors: Jae Hyeon Park, Chan Hee Suk, Sungchul Kim, Jae Ho Kim, Uihui Kwon, Dae Sin Kim, Keon-Ho Yoo, Tae Whan Kim

Institutions: Hanyang University, Samsung Electronics (South Korea), Kyung Hee University

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Research Foundation, National Research Foundation of Korea, Samsung

Awards: G5696885126, G6204925790, G6448836149

OpenAlex ID: W4292793848

FWCI: 0.137

Cites: 19

Cited by: 4

Related to: 10