Year: 2019
Type: preprint
Abstract: We present code constructions for masking $u$ partially stuck memory cells with $q$ levels and correcting additional random errors. The results are achieved by combining the methods for masking and error correction for stuck cells in [1] with the masking-only results for partially stuck cells in [2]. We present two constructions for masking $u1$ and $q>2$, all new constructions require less redundancy for masking partially stuck cells than previous work on stuck cells, which in turn can result in higher code rates at the same masking and error correction capability.
Source: arXiv (Cornell University)
Institution: Technical University of Munich
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4297877708