Work

Error-correction coding for hot-swapping semiconductor devices

Year: 2023

Type: article

Abstract: A memory read operation is directed at a group of semiconductor devices from which a first semiconductor device has been removed. An error in data for the memory read operation is detected based on error-correction coding (ECC). The error is caused at least in part by the first semiconductor device having been removed. ECC is used to determine corrected data for the memory read operation.

Source: OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)

Author: Roberts, David A.

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W4302169300

FWCI:

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