Work

X-Ray Device Alteration Using a Scanning X-Ray Microscope

Year: 2022

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2022p0153

Authors: William Lo, Puneet Gupta, Rakshith Venkatesh, Rudolf Schlangen, Howard Marks, Bruce Cory, Frances Su, Benjamin Stripe, Sylvia Lewis, Wenbing Yun

Institutions: Nvidia (United States), Sigray (United States)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4307553935

FWCI: 3.367

Cites:

Cited by: 9

Related to: 10