Work

AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking

Year: 2022

Type: article

Source: Journal of Electronic Testing

DOI: 10.1007/s10836-022-06028-5

Authors: Yadi Zhong, Ayush Jain, M. Tanjidur Rahman, Navid Asadizanjani, Jiafeng Xie, Ujjwal Guin

Institutions: Auburn University, University of Florida, Villanova University

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

Funder: National Science Foundation

Award: CRII: SaTC: Robust Design-for-Security (DFS) Architecture for Enabling Trust in Integrated Circuits (IC) Manufacturing and Test

OpenAlex ID: W4307994177

FWCI: 1.901

Cites: 85

Cited by: 12

Related to: 10