Work

Fast microwave calibration system for cryogenic device characterization

Year: 2022

Type: article

Source: Journal of Instrumentation

DOI: 10.1088/1748-0221/17/11/p11021

Authors: Yong Chen, Peng Duan, Zhi-long Jia, Xin-xin Yang, Chi Zhang, Wei-cheng Kong, Hai-Ou Li, Gang Cao, Guo-Ping Guo

Institutions: University of Science and Technology of China, Chinese Academy of Sciences, CAS Key Laboratory of Quantum Information, USTC, Origin Quantum Computing Technology Company (China)

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4309190504

FWCI:

Cites: 18

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Related to: 10