Work

Investigation of new micromachined coplanar probe for near-field microwave microscopy

Year: 2018

Type: article

Source: Microsystem Technologies

DOI: 10.1007/s00542-018-3766-9

Authors: Sofiane Ben Mbarek, Fethi Choubani, Bernard Cretin

Institutions: Centre National de la Recherche Scientifique, University of Carthage, Franche-Comté Électronique Mécanique Thermique et Optique - Sciences et Technologies, École Nationale Supérieure de Mécanique et des Microtechniques, Université de Franche-Comté

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2786085227

FWCI: 0.191

Cites: 15

Cited by: 4

Related to: 10