Work

Investigation of Performance Degradation in 600-V HD-GITs Under Power Cycling Tests

Year: 2022

Type: article

Source: IEEE Journal of Emerging and Selected Topics in Power Electronics

DOI: 10.1109/jestpe.2022.3213550

Authors: Xu Huang, Pengju Sun, Zhiyuan He, Guoguang Lu, Xiong Du, Quanming Luo

Institutions: Chongqing University, China Electronic Product Reliability and Environmental Test Institute

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4312633523

FWCI: 0.612

Cites: 19

Cited by: 12

Related to: 10