Work

Profiling of carrier density in semiconductor lasers via spectral analysis of side spontaneous emission

Year: 1996

Type: conference-paper

Source: Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

DOI: 10.1364/cleo_europe.1996.cwf6

Authors: Edward H. Sargent, Dorothy Pavlidis, Nicolae Golinescu, J.M. Xu, Richard Clayton, Hanan Anis, H. B. Kim

Institution: University of Toronto

Language: English

Topic: Semiconductor Lasers and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4320803272

FWCI:

Cites: 3

Cited by:

Related to: 10